Replacement of the Aging Gallium Focused Ion Beam-Scanning Electron Microscope (Ga FIB-SEM) Instrument in the Nanoscale Imaging and Analysis Center (NIAC)

Description:
The Nanoscale Imaging and Analysis Center (NIAC) will be acquiring a Gallium Focused Ion Beam-Scanning Electron Microscope (Ga FIB-SEM), which combines a Ga focused ion beam (FIB) for controlled sample patterning and milling with a scanning electron microscope (SEM). A FIB-SEM is an essential component of any modern research facility for materials science, microelectronics research and related areas including solid state chemistry, condensed matter physics and mineralogy.

NIAC provides state-of-the-art instrumentation, support facilities and expert technical assistance for research and education in materials, serving materials science research needs of the University of Wisconsin–Madison, the state of Wisconsin, and the nation.

PRINCIPAL INVESTIGATOR:
Paul Voyles, professor of materials science

CO-PRINCIPAL INVESTIGATOR:
Julie Morasch, director of the Wisconsin Centers for Nanoscale Technology (WCNT)

CORE:
Nanoscale Imaging and Analysis Center (NIAC)