Replacement and Enhancement of Microanalysis System on the Scanning Electron Microscope (SEM) in the Nanoscale Imaging and Analysis Center (NIAC)

Description:
The Nanoscale Imaging and Analysis Center (NIAC) will both replace the current energy dispersive x-ray spectroscopy (EDS) system on their scanning electron microscope and add additional capabilities with electron backscatter diffraction (EBSD). This will provide for a higher range of currents and allow it to better capitalize the value of these new additions by providing higher signals and superior data.

The NIAC provides state-of-the-art instrumentation, support facilities and expert technical assistance for research and education in materials, serving materials science research needs of the University of Wisconsin–Madison, the state of Wisconsin, and the nation.

PRINCIPAL INVESTIGATOR:
Kumar Sridharan, professor of nuclear engineering and engineering physics

CO-PRINCIPAL INVESTIGATOR:
Julie Morasch, director of the Wisconsin Centers for Nanoscale Technology (WCNT)

CORE:
Nanoscale Imaging and Analysis Center (NIAC)