Replacement of Transmission Electron Microscopy Elemental Analysis Capability in the Nanoscale Imaging and Analysis Center
This project seeks to upgrade a scanning transmission electron microscope in the Nanoscale Imaging and Analysis Center with new microanalysis capabilities. It will add an energy dispersive x-ray spectrometer to the microscope, which will enable elemental analysis and elemental mapping with ~1 nanometer spatial resolution. The upgrade will increase capability and usage for several campus departments and research centers.
Research areas includes materials under extreme conditions such as highly corrosive and/or radiation environments, materials for nuclear energy, advanced metal alloys including metallic glasses, and qubit and related microelectronic devices.
Paul Voyles, professor of materials science and engineering
Jerry Hunter, director of the Wisconsin Centers for Nanoscale Technology
Nanoscale Imaging and Analysis Center