Replacement of Transmission Electron Microscopy Elemental Analysis Capability in the Nanoscale Imaging and Analysis Center

Description:

This project seeks to upgrade a scanning transmission electron microscope in the Nanoscale Imaging and Analysis Center with new microanalysis capabilities. It will add an energy dispersive x-ray spectrometer to the microscope, which will enable elemental analysis and elemental mapping with ~1 nanometer spatial resolution. The upgrade will increase capability and usage for several campus departments and research centers.

Research areas includes materials under extreme conditions such as highly corrosive and/or radiation environments, materials for nuclear energy, advanced metal alloys including metallic glasses, and qubit and related microelectronic devices.

PRINCIPAL INVESTIGATOR:

Paul Voyles, professor of materials science and engineering

CO-PRINCIPAL INVESTIGATOR:

Jerry Hunter, director of the Wisconsin Centers for Nanoscale Technology

CORE: 

Nanoscale Imaging and Analysis Center