Replacement of Transmission Electron Microscopy Elemental Analysis Capability in the Nanoscale Imaging and Analysis Center
Description:
This project seeks to upgrade a scanning transmission electron microscope in the Nanoscale Imaging and Analysis Center with new microanalysis capabilities. It will add an energy dispersive x-ray spectrometer to the microscope, which will enable elemental analysis and elemental mapping with ~1 nanometer spatial resolution. The upgrade will increase capability and usage for several campus departments and research centers.
Research areas includes materials under extreme conditions such as highly corrosive and/or radiation environments, materials for nuclear energy, advanced metal alloys including metallic glasses, and qubit and related microelectronic devices.
PRINCIPAL INVESTIGATOR:
Paul Voyles, professor of materials science and engineering
CO-PRINCIPAL INVESTIGATOR:
Jerry Hunter, director of the Wisconsin Centers for Nanoscale Technology
CORE:
Nanoscale Imaging and Analysis Center